Mahsulot tavsifi
Study material on the theoretical principles and operation of Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM) for investigating surfaces at the nanoscale level
#afm#atom-kuch mikroskopiyasi#skanerlovchi zondli mikroskopiya
Muallif
Jizzax ReklamaTasdiqlangan muallif
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